Junction parameters for silicon devices characterization
M. de la Bardonnie, N. Toufik, C. Salamé, S. Dib, P. Mialhe, A. Hoffmann, J.-P. CharlesVolume:
39
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0026-2714(99)00096-7
File:
PDF, 223 KB
english, 1999