Improved SRAM failure diagnosis for process monitoring via current signature analysis
M. Schienle, Th. Zanon, D. Schmitt-LandsiedelVolume:
39
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(99)00139-0
File:
PDF, 483 KB
english, 1999