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Stress relaxation and phase stability of cubic boron nitride films during ion post implantation and annealing
C. Fitz, W. Fukarek, W. MöllerVolume:
408
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(02)00089-5
File:
PDF, 129 KB
english, 2002