Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi2Ta2O9 thin films
Valmor R Mastelaro, Cesar R Foschini, José A VarelaVolume:
415
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(02)00490-x
File:
PDF, 825 KB
english, 2002