Thin films: stress, strain and structure–property relations

Thin Solid Films 2003 Vol. 424; Iss. 1

Thin films: stress, strain and structure–property relations

Mark Yeadon, Zeng Kaiyang, Hng Huey Hoon, Ray D Twesten, Robin Abothu
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Volume:
424
Year:
2003
Language:
english
DOI:
10.1016/s0040-6090(02)00899-4
File:
PDF, 31 KB
english, 2003
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