Lineshape analysis of RHEED pattern: scaling behavior and linewidth oscillations
Frédéric Dulot, Bertrand Kierren, Daniel MalterreVolume:
428
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0040-6090(02)01274-9
File:
PDF, 1.03 MB
english, 2003