Helical-type surface defects in InGaN thin films epitaxially grown on GaN templates at reduced temperatures
P.Q Miraglia, E.A Preble, A.M Roskowski, S Einfeldt, S.H Lim, Z Liliental-Weber, R.F DavisVolume:
437
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0040-6090(03)00611-4
File:
PDF, 1.22 MB
english, 2003