Infrared optical properties of Bi2Ti2O7 thin films by spectroscopic ellipsometry
Z.G. Hu, S.W. Wang, Z.M. Huang, G.S. Wang, Z.H. Zhang, W. Lu, J.H. ChuVolume:
440
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(03)00824-1
File:
PDF, 115 KB
english, 2003