Structure-hardness relations in sputtered Ti–Al–V–N films
H Poláková, J Musil, J Vlček, J Allaart, C MittererVolume:
444
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0040-6090(03)01096-4
File:
PDF, 366 KB
english, 2003