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Conductivity of boron-implanted polycrystalline thin silicon films
F. Mansour, M. Bouchemat, M. Boukezzata, N.H. Touidjen, D. Bielle-Daspet, K. MirouhVolume:
261
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(94)06455-5
File:
PDF, 554 KB
english, 1995