Lattice distortion in dry-etched Si/SiGe quantum dot array studied by 2D reciprocal space mapping using synchrotron X-ray diffraction
W.-X Ni, J Birch, Y.S Tang, K.B Joelsson, C Sotomayor-Torres, Å Kvick, G.V HanssonVolume:
294
Year:
1997
Pages:
4
DOI:
10.1016/s0040-6090(96)09232-2
File:
PDF, 321 KB
1997