PEELS and EXELFS characterization of diamond films grown by...

Thin Solid Films 1997 Vol. 304; Iss. 1-2

PEELS and EXELFS characterization of diamond films grown by the HF-CVD technique on non-scratched Si substrates

A. Duarte-Moller, O. Contreras, G.A. Hirata, M. Avalos-Borja, D.H. Galván, L. Morales de la Garza, L. Cota-Araiza
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Volume:
304
Year:
1997
Language:
english
Pages:
3
DOI:
10.1016/s0040-6090(96)09598-3
File:
PDF, 254 KB
english, 1997
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