Investigation of dislocations and traps in MBE grown...

Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures

A.Y Du, M.F Li, T.C Chong, S.J Xu, Z Zhang, D.P Yu
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Volume:
311
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0040-6090(97)00314-3
File:
PDF, 477 KB
english, 1997
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