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On-chip structures for timing measurement and test
D.J. Kinniment, O.V. Maevsky, A. Bystrov, G. Russell, A.V. YakovlevVolume:
27
Year:
2003
Language:
english
Pages:
11
DOI:
10.1016/s0141-9331(03)00096-6
File:
PDF, 259 KB
english, 2003