Fault security analysis of CMOS VLSI circuits using...

Integration, the VLSI Journal 2002 Vol. 32; Iss. 1-2

Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models

Donald Shaw, Dhamin Al-Khalili, Come Rozon
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Volume:
32
Year:
2002
Language:
english
Pages:
21
DOI:
10.1016/s0167-9260(02)00043-3
File:
PDF, 238 KB
english, 2002
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