Modelling roughness, grain and confinement effects on...

Modelling roughness, grain and confinement effects on transport in embedded metallic films

Gary D. Knight, Tom Smy
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Volume:
64
Year:
2002
Language:
english
Pages:
12
DOI:
10.1016/s0167-9317(02)00816-x
File:
PDF, 704 KB
english, 2002
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