Effect of interfacial oxide on electron mobility in metal...

Effect of interfacial oxide on electron mobility in metal insulator semiconductor field effect transistors with Al2O3 gate dielectrics

Kazuyoshi Torii, Yasuhiro Shimamoto, Shin-ichi Saito, Katsunori Obata, Tsuyoshi Yamauchi, Digh Hisamoto, Takahiro Onai, Masahiko Hiratani
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Volume:
65
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0167-9317(03)00163-1
File:
PDF, 147 KB
english, 2003
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