Radiation damage measurements in room-temperature...

Radiation damage measurements in room-temperature semiconductor radiation detectors

Larry A. Franks, Bruce A. Brunett, Richard W. Olsen, David S. Walsh, Gyögy Vizkelethy, Jacob I. Trombka, Barney L. Doyle, Ralph B. James
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Volume:
428
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0168-9002(98)01585-x
File:
PDF, 162 KB
english, 1999
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