Gate-controlled diodes for characterization of the Si–SiO2...

Gate-controlled diodes for characterization of the Si–SiO2 interface with respect to surface effects of silicon detectors

C Becker, C Gößling, C Lichau, T Wübben, J Wüstenfeld, R Wunstorf
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
444
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0168-9002(99)01177-8
File:
PDF, 338 KB
english, 2000
Conversion to is in progress
Conversion to is failed