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The influence of chemical treatments on tungsten films found in integrated circuits
Scott S. Perry, Heather C. Galloway, Paul Cao, Evelynn J.R. Mitchell, Debbie C. Koeck, Christopher L. Smith, Min Soo LimVolume:
180
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(01)00308-7
File:
PDF, 189 KB
english, 2001