High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope
T Hasegawa, T Kageyama, T Fukumura, N Okazaki, M Kawasaki, H Koinuma, Y.K Yoo, F Duewer, X.-D XiangVolume:
189
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(01)01011-x
File:
PDF, 237 KB
english, 2002