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Estimation of useful yield in surface analysis using single photon ionisation
B.V King, M.J Pellin, J.F Moore, I.V Veryovkin, M.R Savina, C.E TripaVolume:
203-204
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(02)00636-0
File:
PDF, 237 KB
english, 2003