LEXES and SIMS as complementary techniques for full...

LEXES and SIMS as complementary techniques for full quantitative characterization of nanometer structures

C. Hombourger, P.F. Staub, M. Schuhmacher, F. Desse, E. de Chambost, C. Hitzman
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Volume:
203-204
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(02)00680-3
File:
PDF, 148 KB
english, 2003
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