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Time-of-flight-SIMS and XPS characterization of metal doped polymers
Th. Gross, I. Retzko, J. Friedrich, W. UngerVolume:
203-204
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0169-4332(02)00769-9
File:
PDF, 115 KB
english, 2003