KPFM imaging of Si(1 1 1)53×53-Sb surface for atom...

Applied Surface Science 2003 Vol. 210; Iss. 1-2

KPFM imaging of Si(1 1 1)53×53-Sb surface for atom distinction using NC-AFM

Kenji Okamoto, Kentaro Yoshimoto, Yasuhiro Sugawara, Seizo Morita
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Volume:
210
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(02)01492-7
File:
PDF, 374 KB
english, 2003
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