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Nucleation and growth of nanocrystalline silicon studied by TEM, XPS and ESR
Keisuke Sato, Tomio Izumi, Mitsuo Iwase, Yoshiyuki Show, Hiroshi Morisaki, Toshie Yaguchi, Takeo KaminoVolume:
216
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(03)00445-8
File:
PDF, 325 KB
english, 2003