Nondestructive depth profiling of oxidized FeCr alloy by the glancing-incidence and -takeoff X-ray fluorescence method
Kouichi Tsuji, Kichinosuke HirokawaVolume:
103
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(96)00541-7
File:
PDF, 667 KB
english, 1996