In situ investigation of the formation of an intermixed phase at the NiSi(100) interface by photoelectron spectroscopic methods
R Kilper, S Teichert, P OelhafenVolume:
123-124
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0169-4332(97)00569-2
File:
PDF, 310 KB
english, 1998