BEEM studies of the PtSi/Si(100) interface electronic...

Journal of Electron Spectroscopy and Related Phenomena 1999 Vol. 105; Iss. 1

BEEM studies of the PtSi/Si(100) interface electronic structure

T Vdovenkova, V Strikha, F Cardon, R.L Van Meirhaeghe, G Vanalme
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Volume:
105
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0368-2048(99)00028-6
File:
PDF, 115 KB
english, 1999
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