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Environmental degradation properties of YBa2Cu3O7−δ and Y0.6Ca0.4Ba1.6La0.4Cu3O7−δ thin film structures
Ji-Ping Zhou, Rung-Kuang Lo, Steven M. Savoy, Mark Arendt, Jeff Armstrong, Du-Yu Yang, John Talvacchio, John T. McDevittVolume:
273
Year:
1997
Language:
english
Pages:
10
DOI:
10.1016/s0921-4534(96)00631-4
File:
PDF, 811 KB
english, 1997