Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern
F Pailloux, R.J Gaboriaud, C Champeaux, A CatherinotVolume:
288
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0921-5093(00)00858-3
File:
PDF, 583 KB
english, 2000