Epitaxial stress study by large angle convergent beam...

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern

F Pailloux, R.J Gaboriaud, C Champeaux, A Catherinot
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Volume:
288
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0921-5093(00)00858-3
File:
PDF, 583 KB
english, 2000
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