Scanning SQUID microscope technique for measurements of...

Applied Superconductivity 1997 Vol. 5; Iss. 7-12

Scanning SQUID microscope technique for measurements of ultrathin film magnetic properties

Sergey A. Gudoshnikov, Ludmila V. Matveets, Konstantin A. Andreev, Alexander M. Tishin, Oleg V. Snigirev, Michael Mueck, Joerg Dechert, Christoph Heiden
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Volume:
5
Year:
1997
Language:
english
Pages:
5
DOI:
10.1016/s0964-1807(98)00005-2
File:
PDF, 230 KB
english, 1997
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