![](/img/cover-not-exists.png)
Trapped electron and hole distribution mismatch induced reliability degradation of SONOS type memory devices
Shi, Guangjian, Pan, Liyang, Sun, Lei, Zhang, Zhigang, Xu, JunVolume:
14
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/s1007-0214(09)70006-9
File:
PDF, 799 KB
english, 2009