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Model-Based Test Case Generation for Smart Cards
J. Philipps, A. Pretschner, O. Slotosch, E. Aiglstorfer, S. Kriebel, K. SchollVolume:
80
Year:
2003
Language:
english
Pages:
15
DOI:
10.1016/s1571-0661(04)80817-x
File:
PDF, 261 KB
english, 2003