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ChemInform Abstract: Cordierite-Based Dielectric Thick Films on an Oxidized Copper Layer: Microstructural Evidence of Copper Diffusion.
Yong S. Cho, David T. Hoelzer, Walter A. Schulze, Vasantha R. W. AmarakoonVolume:
30
Year:
1999
Pages:
1
DOI:
10.1002/chin.199940220
File:
PDF, 31 KB
1999