Damage-Enhanced Creep in a Siliconized Silicon Carbide: Phenomenology
SHELDON M. WIEDERHORN, D. ELLIS ROBERTS, TZE-JER CHUANG, LEON CHUCKVolume:
71
Year:
1988
Language:
english
Pages:
7
DOI:
10.1111/j.1151-2916.1988.tb05926.x
File:
PDF, 900 KB
english, 1988