![](/img/cover-not-exists.png)
Predicting Failure Stress of Silicon Nitride Ceramics Using Microfocus Radiography
Daniel J. Cotter, William D. Koenigsberg, Arvid E. Pasto, Leslie J. BowenVolume:
71
Year:
1988
Language:
english
Pages:
1
DOI:
10.1111/j.1151-2916.1988.tb07548.x
File:
PDF, 293 KB
english, 1988