![](/img/cover-not-exists.png)
Characterization of Silicon Carbide Whiskers
Keith R. Karasek, Steven A. Bradley, Jeffry T. Donner, Harry C. Yeh, James L. Schienle, Ho T. FangVolume:
72
Year:
1989
Language:
english
Pages:
7
DOI:
10.1111/j.1151-2916.1989.tb05999.x
File:
PDF, 924 KB
english, 1989