Infant Mortality, Freaks, and Wear-Out: Application of...

Journal of the American Ceramic Society 1989 Vol. 72; Iss. 12

Infant Mortality, Freaks, and Wear-Out: Application of Modern Semiconductor Reliability Methods to Ceramic Multilayer Capacitors

Stewart K. Kurtz, Solomon Levinson, Dexiang Shi
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Volume:
72
Year:
1989
Language:
english
Pages:
11
DOI:
10.1111/j.1151-2916.1989.tb06066.x
File:
PDF, 1.71 MB
english, 1989
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