Fourier Transform Infrared Microspectroscopy Method to Determine Stress in Sapphire
James W. Rydzak, W. Roger CannonVolume:
72
Year:
1989
Language:
english
Pages:
3
DOI:
10.1111/j.1151-2916.1989.tb07707.x
File:
PDF, 311 KB
english, 1989