Characterization of Polyphasic Silicon Carbide Using...

Journal of the American Ceramic Society 1990 Vol. 73; Iss. 8

Characterization of Polyphasic Silicon Carbide Using Surface-Enhanced Raman and Nuclear Magnetic Resonance Spectroscopy

Neal R. Dando, M. Azar Tadayyoni
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Volume:
73
Year:
1990
Language:
english
Pages:
5
DOI:
10.1111/j.1151-2916.1990.tb07583.x
File:
PDF, 464 KB
english, 1990
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