Microstructural Characterization of Cofired...

Journal of the American Ceramic Society 1992 Vol. 75; Iss. 10

Microstructural Characterization of Cofired Tungsten-Metallized High-Alumina Electronic Substrates

Gesa Behrens, Arthur H. Heuer
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Volume:
75
Year:
1992
Language:
english
Pages:
10
DOI:
10.1111/j.1151-2916.1992.tb05510.x
File:
PDF, 1.31 MB
english, 1992
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