Quantitative Comparison of TEM Techniques for Determining Amorphous Intergranular Film Thickness
Michael K. Cinibulk, Hans-Joachim Kleebe, Manfred RühleVolume:
76
Year:
1993
Language:
english
Pages:
7
DOI:
10.1111/j.1151-2916.1993.tb03801.x
File:
PDF, 959 KB
english, 1993