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Contact Damage Accumulation in Tic3SiC2
It Meng Low, Seung Kun Lee, Brian R. Lawn, Michel W. BarsoumVolume:
81
Year:
1998
Language:
english
Pages:
4
DOI:
10.1111/j.1151-2916.1998.tb02320.x
File:
PDF, 917 KB
english, 1998