Contact Damage Accumulation in Tic3SiC2

Contact Damage Accumulation in Tic3SiC2

It Meng Low, Seung Kun Lee, Brian R. Lawn, Michel W. Barsoum
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
81
Year:
1998
Language:
english
Pages:
4
DOI:
10.1111/j.1151-2916.1998.tb02320.x
File:
PDF, 917 KB
english, 1998
Conversion to is in progress
Conversion to is failed