In Situ Measurement of Bridging Stresses in Toughened...

Journal of the American Ceramic Society 1999 Vol. 82; Iss. 5

In Situ Measurement of Bridging Stresses in Toughened Silicon Nitride Using Raman Microprobe Spectroscopy

Giuseppe Pezzotti, Naoki Muraki, Naoki Maeda, Kouji Satou, Toshihiko Nishida
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Volume:
82
Year:
1999
Language:
english
Pages:
8
DOI:
10.1111/j.1151-2916.1999.tb01903.x
File:
PDF, 793 KB
english, 1999
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