Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep-Resistant Yttrium- and Lanthanum-Doped Alumina Microstructures
John Bruley, Junghyun Cho, Helen M. Chan, Martin P. Harmer, Jeffrey M. RickmanVolume:
82
Year:
1999
Language:
english
Pages:
6
DOI:
10.1111/j.1151-2916.1999.tb02169.x
File:
PDF, 252 KB
english, 1999