Scanning Transmission Electron Microscopy Analysis of Grain...

Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep-Resistant Yttrium- and Lanthanum-Doped Alumina Microstructures

John Bruley, Junghyun Cho, Helen M. Chan, Martin P. Harmer, Jeffrey M. Rickman
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
82
Year:
1999
Language:
english
Pages:
6
DOI:
10.1111/j.1151-2916.1999.tb02169.x
File:
PDF, 252 KB
english, 1999
Conversion to is in progress
Conversion to is failed