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Effect of a Transverse Tensile Stress on the Electric-Field-Induced Domain Reorientation in Soft PZT: In Situ XRD Study
Xiaoping Li, Wan Y. Shih, James S. Vartuli, David L. Milius, Ilhan A. Aksay, Wei-Heng ShihVolume:
85
Year:
2002
Language:
english
Pages:
7
DOI:
10.1111/j.1151-2916.2002.tb00182.x
File:
PDF, 176 KB
english, 2002