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Electrical Conductivity Evaluation of Postharvest Strawberry Damage
Y. Jiang, T. Shiina, N. Nakamura, A. NakaharaVolume:
66
Year:
2001
Language:
english
Pages:
4
DOI:
10.1111/j.1365-2621.2001.tb15220.x
File:
PDF, 112 KB
english, 2001