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Depth measurements of etch-pits in GaN with shape reconstruction from SEM images
M. WZOREK, A. CZERWINSKI, J. RATAJCZAK, A. LUI, E. IACOB, J. KĄTCKIVolume:
237
Year:
2010
Language:
english
Pages:
4
DOI:
10.1111/j.1365-2818.2009.03232.x
File:
PDF, 267 KB
english, 2010