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TEM characterization of MBE grown CdTe/ZnTe axial nanowires
P. DŁUZEWSKI, E. JANIK, S. KRET, W. ZALESZCZYK, D. TANG, G. KARCZEWSKI, T. WOJTOWICZVolume:
237
Year:
2010
Language:
english
Pages:
4
DOI:
10.1111/j.1365-2818.2009.03256.x
File:
PDF, 412 KB
english, 2010